Eds testing services by MicroVision Laboratories? ?We partner with companies in all phases of product development and sales, including R&D, manufacturing, QC, advertising and failure analysis. Our laboratory offers a highly-trained and experienced staff utilizing a powerful set of analytical tools (SEM with EDS and backscatter detectors, Bruker X-Flash elemental mapping, X-Ray imaging, Micro-FTIR spectroscopy, Micro-XRF, light microscopy, cross sectioning/precision polishing and microhardness testing).
A device manufacturer had a product that involved a few different boards with varying components. There were circumstances that caused the need for a change in manufacturers of one of the boards. Due to this change, the device production at this facility would be shut down until the boards from this new vendor were validated. The Quality Control department required that an inspection of the solder joints of some of the components on the board be analyzed in order to determine whether this new board manufacturer met their specifications. If the desired specifications were met and no issues were found during the inspection of the joints then production of the devices could resume. Read more info on microvision laboratory.
The client was able to determine the source of the black dust was due to the mechanical breakdown of the foam cushions in the impacted room, and not from mold or mildew growth. The experienced analysts at MicroVision Labs were able to differentiate the foam materials from either blown cellulose or urethane foam insulation or air filters, allowing for the client to easily remove the problem cushions.
How do I submit a sample or a set of samples? To submit a sample or set of samples, please see the page How to Submit Samples. What if I believe my samples are hazardous? We are not equipped to handle or dispose of every kind of hazardous material. Please call us before sending in any potentially hazardous samples. In cases where we are able to analyze your harzardous samples we may not be able to dispose of them and therefore we will return them to you.
Translucent or transparent coatings on metallic or semi-conductor substrates are very difficult to image due to their reflective nature. Nomarski/DIC imaging is an effective method for accentuating differences in thickness, density or the optical index in these cases. This analysis enhances and highlights subtle features with brilliant color gradients and captures them with a high resolution digital imaging system. Let us bring out your sample’s hidden features. Discover extra info on this website.
The SEM was used to examine the crystal morphology, and the EDS spectrum showed primarily carbon and oxygen, with small amounts of nitrogen and phosphorous. This indicated an organic material as the primary component. Because the SEM-EDS analysis showed the material was primarily a carbon based organic crystalline material, a Fourier transform infrared spectroscopy (FTIR) examination was performed on the suspect material. This analysis provides necessary information about the functional groups of the organic material in order to identify the unknown organic.